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Beilstein J. Nanotechnol. 2015, 6, 2015–2027, doi:10.3762/bjnano.6.205
Figure 1: Schematic representation of the OP model. (a) A representative force–distance curve for the OP mode...
Figure 2: SPM control units and interconnections for a single tower system [17].
Figure 3: Positioning of the multi-probe system inside the acoustic chamber.
Figure 4: Experimental setup demonstrating the proposed two probe nanoindentation technique.
Figure 5: An example resonance response of AFM probes used in the experiments.
Figure 6: Experimental data showing AFM probe measurements on top of the diamond indenter for a fused silica ...
Figure 7: Fused silica force–distance curve.
Figure 8: Spring constant vs maximum depth of penetration.
Figure 9: Finite element analysis data as compared to experimental data.
Figure 10: Images of cube-corner diamond tip used in nanoindentation experiments. (a) A 3D representation of A...
Figure 11: Force–distance curves on silicon substrate.
Figure 12: Topography and cross-sectional profile of indent on silicon.
Figure 13: Force–distance curves on Corning Eagle Glass substrate.
Figure 14: Power-law fitting to the unloading part of a silicon force–distance curve.